The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2011
Filed:
May. 10, 2004
Gopal Vasudevan, San Jose, CA (US);
Robert Duncan Reardon, Mountain View, CA (US);
Eric Hartel Smith, San Jose, CA (US);
Kenneth John Triebes, San Jose, CA (US);
Gopal Vasudevan, San Jose, CA (US);
Robert Duncan Reardon, Mountain View, CA (US);
Eric Hartel Smith, San Jose, CA (US);
Kenneth John Triebes, San Jose, CA (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
System and method for estimating and correcting an aberration of an optical system. The method includes capturing a first plurality of images on a first plurality of planes. The first plurality of images is formed by at least the optical system. Additionally, the method includes processing at least information associated with the first plurality of images, and determining a first auxiliary function based upon at least the information associated with the first plurality of images. The first auxiliary function represents a first aberration of the optical system. Moreover, the method includes adjusting the optical system based upon at least information associated with the first auxiliary function.