The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2011

Filed:

Mar. 26, 2007
Applicants:

Wen-chiao Ho, Tainan, TW;

Chin-hung Chang, Tainan, TW;

Chun-hsiung Hung, Hsinchu, TW;

Kuen-long Chang, Taipei, TW;

Inventors:

Wen-Chiao Ho, Tainan, TW;

Chin-Hung Chang, Tainan, TW;

Chun-Hsiung Hung, Hsinchu, TW;

Kuen-Long Chang, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for checking reading errors of a memory includes receiving a first data fragment and accordingly generating a first ECC and a first count index; writing the first data fragment, the first ECC and the first count index into a memory; reading the first data fragment from the memory as a second data fragment, generating a second ECC and second count index according to the second data fragment; determining whether the first count index and second count index are equal; determining whether the first ECC and the second ECC are equal; and outputting the second data fragment when the first count index is equal to the second count index and the first ECC is equal to the second ECC.


Find Patent Forward Citations

Loading…