The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Jun. 23, 2009
Albrecht Schroth, Herrenberg, DE;
Sabine Funke-schaeff, Aidlingen-Dachtel, DE;
Albrecht Schroth, Herrenberg, DE;
Sabine Funke-Schaeff, Aidlingen-Dachtel, DE;
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Abstract
In a method of testing a device under test (DUT) using a test device adapted to provide a connection to a central controller, a test procedure activation signal is supplied from the central controller to the test device. A test procedure for testing the DUT is performed on the basis of test procedure data, upon receipt of the test procedure activation signal. The test procedure is adjustable upon receipt of a feedback signal from the DUT. The test procedure is adjusted by 1) receiving a feedback signal from the DUT, 2) determining from the feedback signal properties of a physical connection between the test device and the DUT, and 3) adjusting the test procedure to modify the test signal and compensate for the properties of the physical connection between the test device and the DUT.