The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2011

Filed:

Feb. 27, 2008
Applicants:

Wayne Booth, San Jose, CA (US);

Feng Wang, Sunnyvale, CA (US);

Inventors:

Wayne Booth, San Jose, CA (US);

Feng Wang, Sunnyvale, CA (US);

Assignee:

NetApp, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method are provided for avoiding categorization of non-error events as actual error events. This is accomplished by categorizing potential error events as actual error events or non-error events based on a proximity to a physical layer signal state change. By this feature, the result of the categorization may be used to more effectively avoid categorizing non-error events and accompanying noise, etc., as actual error events. To this end, in various embodiments, more accurate error counting is afforded to preclude inadvertent disabling, etc. of a mass storage device or associated link that would otherwise result from a flawed error count.


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