The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2011
Filed:
May. 21, 2008
Yasunari Ishikawa, Mitaka, JP;
Yasunari Ishikawa, Mitaka, JP;
Tokyo Seimitsu Co., Ltd., Tokyo, JP;
Abstract
In a surface shape measurement device that measures the surface shape of a sample (WW) by moving a probe () in a sliding fashion along the surface of the sample (WW) and thereby detecting the amount of displacement of the probe () caused by irregularities on the surface, an initial amount of displacement is detected which is the amount of displacement of the probe () when the probe is first placed in contact with a measurement start point on the surface of the sample (WW), and the amount of displacement of the probe (), detected as it is moved in a sliding fashion along the surface, is compared with the initial amount of displacement to determine whether the probe () has reached a measurement end point.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile