The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2011
Filed:
Mar. 11, 2008
Thomas S. Barnett, Jericho, VT (US);
Jeanne Paulette Spence Bickford, Essex Junction, VT (US);
Nazmul Habib, South Burlington, VT (US);
Susan K. Lichtensteiger, Essex Junction, VT (US);
Raymond J. Rosner, Colchester, VT (US);
Thomas S. Barnett, Jericho, VT (US);
Jeanne Paulette Spence Bickford, Essex Junction, VT (US);
Nazmul Habib, South Burlington, VT (US);
Susan K. Lichtensteiger, Essex Junction, VT (US);
Raymond J. Rosner, Colchester, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An apparatus, method, and program product are provided to predict yield loss associated with performance screens or leakage screens. A leakage model is correlated to an on-chip measurement. Current limited yields are determined from the leakage model. A database is formed relating performance sigma cut-points to the circuit limited yields. A product is quoted based on the circuit limited yield for one of the performance sigma cut-points taken from the database. The quote is tied to the product design and testing.