The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2011

Filed:

Jan. 11, 2008
Applicants:

Jason Raymond Baumgartner, Austin, TX (US);

Geert Janssen, Putnam Valley, NY (US);

Hari Mony, Austin, TX (US);

Viresh Paruthi, Austin, TX (US);

Inventors:

Jason Raymond Baumgartner, Austin, TX (US);

Geert Janssen, Putnam Valley, NY (US);

Hari Mony, Austin, TX (US);

Viresh Paruthi, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, system and computer program product for reversing effects of reparameterization is disclosed. The method comprises receiving an original design, an abstracted design, and a first trace over the abstracted design. One or more conditional values are populated into the first trace over the abstracted design, and a k-step satisfiability check is cast to obtain a second trace. One or more calculated values are concatenated to an initial gate set in the second trace with one or more established values to a generated subset of the initial design in the abstracted trace to form a new trace, and one or more effects of a reparameterization are reversed by returning the new trace over the initial design.


Find Patent Forward Citations

Loading…