The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
Dec. 23, 2008
Keiichi Tanaka, Chiba, JP;
Akikazu Odawara, Chiba, JP;
Satoshi Nakayama, Chiba, JP;
Sumio Iijima, Nagoya, JP;
Shunji Bandow, Nisshin, JP;
Keiichi Tanaka, Chiba, JP;
Akikazu Odawara, Chiba, JP;
Satoshi Nakayama, Chiba, JP;
Sumio Iijima, Nagoya, JP;
Shunji Bandow, Nisshin, JP;
SII NanoTechnology Inc., Chiba, JP;
Abstract
Provided is an X-ray analyzer capable of significantly suppressing an influence of an external magnetic field on a transition edge sensor (TES). The X-ray analyzer includes: a TES () for detecting energy of a received X-ray as a temperature change and outputting the temperature change as a current signal; a superconducting magnetic shield () which contains the TES () and enters a superconducting state; and a room temperature magnetic shield () which covers the superconducting magnetic shield () and performs external magnetic field shielding until the superconducting magnetic shield () enters the superconducting state, in which the superconducting magnetic shield () and the room temperature magnetic shield () are concentrically arranged to have a cylindrical shape.