The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7910284 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 22, 2011

Filed:

Aug. 15, 2007
Applicants:

Kyoko Kojima, Kunitachi, JP;

Hideo Hada, Kawasaki, JP;

Daiju Shiono, Kawasaki, JP;

Inventors:

Kyoko Kojima, Kunitachi, JP;

Hideo Hada, Kawasaki, JP;

Daiju Shiono, Kawasaki, JP;

Assignees:

Hitachi, Ltd., Tokyo, JP;

Tokyo Ohka Kogyo Co., Ltd., Kanagawa-Ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/004 (2006.01); G03F 7/30 (2006.01); C07C 63/00 (2006.01); C07C 43/23 (2006.01);
U.S. Cl.
CPC ...
Abstract

To overcome the problem that a device performance is degraded by the edge roughness of a photoresist pattern, a mixture of polynuclear phenol compounds having, in one molecule, 0 to 6 functional groups which are chemically converted due to actions of an acid with the solubility in an alkaline developer reduced is used as a material for photoresist. In the mixture, two or more triphenyl methane structures are bonded to portions other than the functional group in the nonconjugated state. Furthermore, the mixture comprises polynuclear compounds with the average number of functional groups of 2.5 or below and includes the polynuclear compounds not having any functional group per molecule by 15% or less in the term of weight ratio, and the polynuclear phenol compounds having 3 or more functional groups per molecule by 40% or less.


Find Patent Forward Citations

Kojima, Kyoko. (2011). Materials for photoresist, photoresist composition and method of forming resist pattern (U.S. Patent No. 7910284). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7910284

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