The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
Mar. 18, 2010
Applicants:
Brian S. Merrow, Harvard, MA (US);
Eric L. Truebenbach, Sudbury, MA (US);
Marc Lesueur Smith, Sterling, MA (US);
Inventors:
Brian S. Merrow, Harvard, MA (US);
Eric L. Truebenbach, Sudbury, MA (US);
Marc Lesueur Smith, Sterling, MA (US);
Assignee:
Teradyne, Inc., North Reading, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of controlling a temperature of a test slot in a disk drive testing system includes regulating temperature changes of a subject test slot based on one or more operating conditions of one or more other test slots neighboring the subject test slot.