The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
May. 21, 2007
Sumihiro Maeda, Kanagawa, JP;
Yasuhiro Tokumaru, Kanagawa, JP;
Sumihiro Maeda, Kanagawa, JP;
Yasuhiro Tokumaru, Kanagawa, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
In the present invention, an inspection area for sampled defect data is set which has a predetermined width in the radial direction of a magnetic disk and a length round the circle of the magnetic disk in the circumferential direction thereof or a predetermined length in the circumferential direction thereof, and while limiting the defect data in the inspection area and shifting a narrow and long search frame within the area, continuing defects in the region of the search frame are followed up and detected, thereby, only curved line shaped continuing defects having comparatively large curvature near to the circle of the magnetic disk are selectively detected and acquired as circle shaped defects.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile