The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Apr. 01, 2008
Applicants:

Matthew Becker, Harvard, MA (US);

Zibing Yang, Natick, MA (US);

Qiang Zhang, Northborough, MA (US);

Todd Hinck, Arlington, MA (US);

Larry Tate, Hopkinton, MA (US);

Inventors:

Matthew Becker, Harvard, MA (US);

Zibing Yang, Natick, MA (US);

Qiang Zhang, Northborough, MA (US);

Todd Hinck, Arlington, MA (US);

Larry Tate, Hopkinton, MA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01R 31/28 (2006.01); G01R 11/30 (2006.01); G01R 31/02 (2006.01); G01R 19/00 (2006.01); G01R 23/02 (2006.01); G01R 23/14 (2006.01); G01R 25/00 (2006.01); H03K 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, the present invention includes a system having an electromagnetic coupler probe to electromagnetically sample signals from a device under test or a link under test and a receiver, e.g., configured as an integrated circuit that is to receive the sampled electromagnetic signals from the probe and output digital signals corresponding thereto. Other embodiments are described and claimed.


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