The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2011
Filed:
Aug. 05, 2005
Brian Douglas Stewart, Edinburgh, GB;
Brian Douglas Stewart, Edinburgh, GB;
STMicroelectronics Ltd., Marlow-Buckinghamshire, GB;
Abstract
The method of determining a focus measure from an image includes detecting one or more edges in the image by processing the image with one or more first order edge detection kernels adapted to reject edge phasing effects. A first measure of the strength of each of the edges, and the contrast of each of the edges may be determined. The method may include normalizing the first measure of the strength of each of the edges by the contrast of each of the edges to obtain a second measure of the strength of each of the edges, and resealing the second measure of the strength of each of the edges. The method may also include selecting one or more of the edges from the image in accordance with the second measure of their strengths, and calculating the focus measure from the second measure of the strengths of the selected edges.