The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2011
Filed:
Dec. 24, 2008
Bonnie Weir, Bronxville, NY (US);
Bonnie Weir, Bronxville, NY (US);
Agere Systems Inc., Allentown, PA (US);
Abstract
A hot-carrier injection (HCI) test that permits rapid screening of integrated circuit wafers susceptible to possible HCI-induced failures is disclosed. A method is described that determines transistor stress voltages that results in a transistor HCI-induced post-stress drain current differing from a pre-stress drain current within a desired range. These stress voltages are determined using a wafer with acceptable HCI susceptibility. Additional wafers to be tested are first tested using a described method that uses the determined transistor stress voltages to quickly screen the wafers for HCI susceptibility and, if HCI susceptibility is found, then additional conventional HCI testing may be applied to the susceptible wafers.