The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
Sep. 04, 2007
Juergen K. Lahner, Morgan Hill, CA (US);
Balamurugan Balasubramanian, Santa Clara, CA (US);
Kavitha Chaturvedula, San Jose, CA (US);
Juergen K. Lahner, Morgan Hill, CA (US);
Balamurugan Balasubramanian, Santa Clara, CA (US);
Kavitha Chaturvedula, San Jose, CA (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A method of statistical design closure is disclosed. The method generally includes the steps of (A) reading statistical data from a database, the statistical data defining a plurality of chip yield improvements, one of the chip yield improvements in each one of a plurality of design closure categories respectively, the chip yield improvements capturing historically trends based on a plurality of previous projects, (B) calculating a plurality of targets of a current design closure project based on the statistical data, one of the targets in each one of the design closure categories respectively and (C) generating a resource report to a user that indicates a plurality of resources expected to be used the current design closure project.