The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
Mar. 16, 2007
Applicants:
Leendert M. Huisman, South Burlington, VT (US);
Leah M. Pastel, Essex, VT (US);
Inventors:
Leendert M. Huisman, South Burlington, VT (US);
Leah M. Pastel, Essex, VT (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A structure and method for optimzing scan chain fail disgnosis. First, logic paths from target latches in a target scan chain to observation latches in at least one other observation scan chain are identified. Then, the locations of the observation latches within the other scan chains are optimized.
Huisman, Leendert. (2011). Scan chain diagnostics using logic paths (U.S. Patent No. 7895487). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7895487
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile