The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Mar. 06, 2007
Takeshi Wada, Ebina, JP;
Masahiko Dohi, Hadano, JP;
Takeshi Wada, Ebina, JP;
Masahiko Dohi, Hadano, JP;
Anritsu Corporation, Atsugi-shi, JP;
Abstract
The present invention is to provide a test signal generating apparatus which can generate a test signal for testing a device that dynamically change its operational state in response to a signal or the like. The test signal generating apparatus includes: a pattern storage unithaving patterns; a pattern selecting unitfor selecting a pattern from among the patterns; a test signal generating unitfor generating a test signal having a pattern selected by the pattern selecting unit, a trigger signal receiving unitfor receiving at least one trigger signal, and a pattern map storage unithaving a pattern map defining the number of repetitions for each pattern and a pattern corresponding to a test signal to be generated by the test signal generating unit after the test signal generating unit repeats the test signal on the basis of the number of repetitions.