The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Dec. 11, 2006
Ishwardutt Parulkar, San Francisco, CA (US);
Josephus C. Ebergen, San Francisco, CA (US);
Ilyas Elkin, Sunnyvale, CA (US);
Ishwardutt Parulkar, San Francisco, CA (US);
Josephus C. Ebergen, San Francisco, CA (US);
Ilyas Elkin, Sunnyvale, CA (US);
Oracle America, Inc., Redwood City, CA (US);
Abstract
A method and apparatus for test of asynchronous pipelines. An asynchronous data pipeline includes first and second pluralities of pipeline stages in an alternating sequence. Each of the pipeline stages includes a control circuit, a latch circuit configured to latch data responsive to an indication from the control circuit, and a combinational logic circuit coupled to receive data from an output of the latch circuit. Each of the latch circuits is scannable. The latch circuits of the first and second pluralities of pipeline stages form a data scan chain configured to load test data into the combinational logic circuits during testing of the data pipeline. The data pipeline further includes a control scan chain configured to load control data for operating the control circuits during testing of the data pipeline. Testing of the data pipeline can include independent testing of the control portion or the data portion.