The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2011
Filed:
Dec. 27, 2007
Udayan Gumaste, San Jose, CA (US);
Roland Ruehl, San Carlos, CA (US);
Mathew Koshy, San Mateo, CA (US);
Harsh Deshmane, Sunnyvale, CA (US);
Udayan Gumaste, San Jose, CA (US);
Roland Ruehl, San Carlos, CA (US);
Mathew Koshy, San Mateo, CA (US);
Harsh Deshmane, Sunnyvale, CA (US);
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
The present invention presents a hybrid approach for manufacturability analysis that integrates both a rules-based approach and a models-based approach. For example, a rules-based analysis can be used to optimize the performance of a model-based analysis. The rules analysis can be used to identify specific areas of a layout that can then be analyzed in detail using models. This approach provides numerous advantages. It allows the models-based analysis tool to concentrate upon portions of the layout that requires greater attention and allocate fewer resources towards the areas less critical to the yield.