The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Mar. 05, 2008
Applicant:

Naoto Maeda, Tokyo, JP;

Inventor:

Naoto Maeda, Tokyo, JP;

Assignee:

Elpida Memory, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/04 (2006.01); G01R 23/00 (2006.01); H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to provide a semiconductor memory apparatus which can adjust the locked loop circuit such as a DLL in detail after producing the semiconductor memory apparatus, and moreover, which can adjust the locked loop circuit by using a measuring apparatus which has a low testing frequency, an exclusive-OR circuit generates an adjusting clock signal TCLK obtained by multiplying a frequency of a pair of test clock signals which respectively have a phase difference. A DLL circuit inputs the adjusting clock signal TCLK in place to an external clock signal CLK. The counter circuit counts the control clock signal CCLK outputted from the DLL circuit for a predetermined time. A comparator compares a counted value to an expected value and outputs a comparison result. A phase adjusting circuit outputs an adjusting signal to a delay circuit inside the DLL circuit based on the comparison result outputted from the comparator, and adjusts a phase of the control clock signal CCLK outputted from the DLL circuit.


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