The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2011
Filed:
Feb. 12, 2009
Applicants:
Akinori Shiraishi, Nagano, JP;
Mitsutoshi Higashi, Nagano, JP;
Kei Murayama, Nagano, JP;
Katsunori Yamagishi, Nagano, JP;
Mitsuhiro Aizawa, Nagano, JP;
Inventors:
Akinori Shiraishi, Nagano, JP;
Mitsutoshi Higashi, Nagano, JP;
Kei Murayama, Nagano, JP;
Katsunori Yamagishi, Nagano, JP;
Mitsuhiro Aizawa, Nagano, JP;
Assignee:
Shinko Electric Electric Industries Co., Ltd., Nagano-shi, Nagano, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a semiconductor inspecting device having a contact to be electrically connected to an electrode pad formed in a semiconductor device which is an object to be measured, and a substrate provided with the contact, the contact is provided obliquely to a main surface of the substrate.