The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2011
Filed:
Nov. 27, 2007
Jason R. Baumgartner, Austin, TX (US);
Yee Ja, Round Rock, TX (US);
Hari Mony, Austin, TX (US);
Viresh Paruthi, Austin, TX (US);
Barinjato Ramanandray, Boeblingen, DE;
Jason R. Baumgartner, Austin, TX (US);
Yee Ja, Round Rock, TX (US);
Hari Mony, Austin, TX (US);
Viresh Paruthi, Austin, TX (US);
Barinjato Ramanandray, Boeblingen, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Mechanisms for performing sequential equivalence checking for asynchronous verification are provided. A first model of the integrated circuit design is provided that has additional logic in it to reflect the possible variance in behavior of the asynchronous crossings. A second model of the integrated circuit design is provided that does not have this asynchronous behavior logic but instead correlates to the simplest synchronous model that is usually used for non-asynchronous functional verification tasks. Sequential equivalence checking is performed to verify that the two models are input/output equivalent. In order to address non-uniform arrival times of bus strands, logic is provided for identifying bus strands that have transitioning bits, determining a representative delay for these strands, comparing the representative delays for all of the bus strands to determine the maximum delay for the entire bus, and applying this maximum delay to one of the models.