The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2011

Filed:

Dec. 30, 2004
Applicants:

Efraim Rotem, Haifa, IL;

Jim G. Hermerding, San Jose, CA (US);

Eric Distefano, Livermore, CA (US);

Barnes Cooper, Beaverton, OR (US);

Inventors:

Efraim Rotem, Haifa, IL;

Jim G. Hermerding, San Jose, CA (US);

Eric Distefano, Livermore, CA (US);

Barnes Cooper, Beaverton, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F25D 23/12 (2006.01); G01K 1/08 (2006.01); G06F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for measuring and managing thermal operations of a processor core on a semiconductor die using a sensor positioned in a hotspot of the processor core. A measured temperature reading is determined based upon a temperature sensed by the sensor. Interrupt signals and a software readable register indicating temperature information provide feedback about the thermal environment to the processor. Based upon the measured temperature reading, the interrupt signals direct the processor to modify operation.


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