The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Aug. 07, 2008
Applicants:
Richard L. Campbell, Portland, OR (US);
Michael Andrews, Hillsboro, OR (US);
Inventors:
Richard L. Campbell, Portland, OR (US);
Michael Andrews, Hillsboro, OR (US);
Assignee:
Cascade Microtech, Inc., Beaverton, OR (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); H01P 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A wafer probe comprises a contact conductively interconnected with the wall of a waveguide channel and supported by a substrate that projects from an end of a waveguide channel.
Campbell, Richard. (2011). Differential waveguide probe (U.S. Patent No. 7876114). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7876114
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile