The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Nov. 15, 2007
Applicant:
Hidehisa Sakai, Kawasaki, JP;
Inventor:
Hidehisa Sakai, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01);
U.S. Cl.
CPC ...
Abstract
The analysis model generation unit generates an analysis model for use in an analysis by a finite-element method. A stress distortion analysis unit analyzes a stress and a distortion occurring in finite elements of a continuum by a load using the analysis model for each load cycle cyclically applied to the continuum by the finite-element method. An element damage evaluation unit evaluates a damage by the distortion on the finite elements of the continuum based on the analysis result for each load cycle. A crack growth display unit displays the growth of a crack occurring in the continuum based on a result of the evaluation of the damage.