The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Sep. 27, 2005
Applicants:
Rafael Storz, Heidelberg, DE;
Volker Seyfried, Nussloch, DE;
Inventors:
Rafael Storz, Heidelberg, DE;
Volker Seyfried, Nussloch, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G09G 5/00 (2006.01); H04N 1/04 (2006.01); H04N 5/44 (2006.01); H04N 9/74 (2006.01); H04N 3/223 (2006.01); G01B 11/26 (2006.01); G01B 11/14 (2006.01); G01C 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for superimposing optical information in a scanning microscope includes determining a transformation matrix, and superimposing first optical information of a CCD image and second optical information of at least one piece of second image information using the transformation matrix.
Storz, Rafael. (2011). Method for superimposing optical information in a scanning microscope (U.S. Patent No. 7873241). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7873241
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile