The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2010

Filed:

Jul. 12, 2007
Applicants:

Paul R. Mchugh, Kalispell, MT (US);

Gregory J. Wilson, Kalispell, MT (US);

Kyle M. Hanson, Kalispell, MT (US);

Inventors:

Paul R. McHugh, Kalispell, MT (US);

Gregory J. Wilson, Kalispell, MT (US);

Kyle M. Hanson, Kalispell, MT (US);

Assignee:

Semitool, Inc., Kalispell, MT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C25D 5/00 (2006.01); C25D 21/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for processing a microfeature workpiece. In one embodiment, the apparatus includes a support member configured to carry a microfeature workpiece at a workpiece plane, and a vessel positioned at least proximate to the support member. The vessel has a vessel surface facing toward the support member and positioned to carry a processing liquid. The vessel surface is shaped to provide an at least approximately uniform current density at the workpiece plane. At least one electrode, such as a thieving electrode, is disposed within the vessel. In a further aspect of this embodiment, the thieving electrode can be easily removable along with conductive material it attracts from the processing liquid. The shape of the vessel surface, the current supplied to the thieving electrode and/or the diameter of an aperture upstream of the workpiece are changed dynamically in other embodiments.


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