The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2010
Filed:
Dec. 04, 2007
Muthukumarasamy Karthikeyan, Fishkill, NY (US);
Louis V. Medina, New Windsor, NY (US);
Yunsheng Song, Poughkeepsie, NY (US);
Tso-hui Ting, Stormville, NY (US);
Ping-chuan Wang, Hopewell Junction, NY (US);
Muthukumarasamy Karthikeyan, Fishkill, NY (US);
Louis V. Medina, New Windsor, NY (US);
Yunsheng Song, Poughkeepsie, NY (US);
Tso-Hui Ting, Stormville, NY (US);
Ping-Chuan Wang, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and a method for effectively determining the measurement sensitivity, repeatability, and probe commonality to assist a test engineer determine if the tester meets the specified resolution at every test. A statistical measurement of inherent tester specifications are provided with the added accumulation of the probe contact resistance during the probing process. It further provides a feedback to the test probe card noise level while testing is in progress. Moreover, the system and the method determine the test probing integrity in-situ when testing integrated circuit chips or wafers, dynamically detecting probing errors, and modifying data associated with defective test probes.