The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2010
Filed:
Jan. 15, 2007
Applicants:
Harry Hou, Santa Clara, CA (US);
Takahiro Yamaguchi, Tokyo, JP;
Inventors:
Harry Hou, Santa Clara, CA (US);
Takahiro Yamaguchi, Tokyo, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A measuring apparatus measures a signal-under-test having a signal level that changes at predetermined bit time intervals. A strobe timing generator sequentially generates strobes at even time intervals. A level comparator detects a level of the signal at a timing at which each strobe is sequentially provided. A capture memory stores a signal level output from the comparator. A signal processor calculates a measurement of the signal based on a data series including data taken at even time intervals, each larger than a bit time interval of the signal.