The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Sep. 05, 2007
Jang Dae Kim, San Jose, CA (US);
Steve A. Martinez, Tucson, AZ (US);
Satya N. Mishra, Fort Collins, CO (US);
Alan P. Bucholz, Fort Collins, CO (US);
Hui X. LI, Antioch, CA (US);
Rajesh R. Berigei, San Jose, CA (US);
Jang Dae Kim, San Jose, CA (US);
Steve A. Martinez, Tucson, AZ (US);
Satya N. Mishra, Fort Collins, CO (US);
Alan P. Bucholz, Fort Collins, CO (US);
Hui X. Li, Antioch, CA (US);
Rajesh R. Berigei, San Jose, CA (US);
National Semiconductor Corporation, Santa Clara, CA (US);
Abstract
An Algorithmic Reactive Testbench (ART) system is provided for the simulation/verification of an analog integrated circuit design. The ART system is a high level simulation/verification environment with a user program in which one or more analog testbenches are instantiated and operated as prescribed in an algorithmic reactive testbench program, and the properties of the unit testbenches (test objects) can be influenced by prior analysis of themselves or other tests. The test object may also contain various properties including information reflecting the status of the test object. The modification of a property of a test object is an act of communication in the ART system from the algorithmic reactive testbench program to the test object.