The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Jul. 11, 2008
Jerold A. Williamson, Twinsburg, OH (US);
Michael Chao, Aurora, OH (US);
Joseph N. Furio, Parma Heights, OH (US);
Miao Lei, Beijing, CN;
Jerold A. Williamson, Twinsburg, OH (US);
Michael Chao, Aurora, OH (US);
Joseph N. Furio, Parma Heights, OH (US);
Miao Lei, Beijing, CN;
Keithley Instruments, Inc., Cleveland, OH (US);
Abstract
Provided is a method and system for testing a DUT. The system includes a plurality of testing devices for interacting with the DUT and conducting a plurality of different tests on the DUT, and a computer-readable memory for storing computer-executable instructions defining the plurality of tests to be conducted by the testing device on the DUT. A scheduler component designates at least a first test and a second test from the plurality of tests to be conducted on the DUT in parallel, wherein said designating is based at least in part on content of the computer-executable instructions defining the first test and the second test. And a controller initiates the first test and the second test to be conducted in parallel and initiating at least a third test sequentially relative to at least one of the first and second tests.