The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2010

Filed:

Feb. 17, 2009
Applicants:

Chak Tong Albert Sze, Kwai Chung, HK;

Pei Wei Tsai, Kwai Chung, HK;

Ho Yin Wong, Kwai Chung, HK;

Tin Yi Chan, Hong Kong, HK;

Inventors:

Chak Tong Albert Sze, Kwai Chung, HK;

Pei Wei Tsai, Kwai Chung, HK;

Ho Yin Wong, Kwai Chung, HK;

Tin Yi Chan, Hong Kong, HK;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/344 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device handler for testing and sorting electronic devices has a testing station operative to test the electronic devices and to classify them according to different binning characteristics. A buffer assembly receives electronic devices which have been classified at the testing station, and the buffer assembly further comprises a first loading region having a plurality of receptacles and a second loading region having a plurality of receptacles. An output station is operative to unload electronic devices according to their different binning characteristics from either one of the first or second loading region of the buffer assembly for storage while electronic devices are being loaded onto the other loading region.


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