The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Nov. 19, 2007
Applicants:
Youping Deng, Saratoga, CA (US);
Terry Farren, Fremont, CA (US);
Jing Zhang, San Jose, CA (US);
Inventors:
Assignee:
Hitachi Global Storage Technologies, Netherlands, B.V., Amsterdam, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.