The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2010
Filed:
May. 08, 2008
Kavitha Chaturvedula, San Jose, CA (US);
Juergen K. Lahner, Morgan Hill, CA (US);
Balamurugan Balasubramanian, San Jose, CA (US);
Kavitha Chaturvedula, San Jose, CA (US);
Juergen K. Lahner, Morgan Hill, CA (US);
Balamurugan Balasubramanian, San Jose, CA (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A method of optimizing test code generation is disclosed. The method generally includes the steps of (A) reading from a database (i) a plurality of assertions, (ii) a testbench and (iii) a target code coverage all of a design under test, (B) generating together (i) a plurality of first test vectors to test the assertions and (ii) a plurality of second test vectors applicable to the testbench, (C) identifying one or more redundant test vector sets between the first test vectors and the second test vectors and (D) generating the test code to test the design under test on the testbench using a subset of the first test vectors and the second test vectors, the subset comprising single instances of the redundant test vector sets.