Combined processor access and built in self test in hierarchical memory systems

Abstract

A hierarchical memory includes a plurality of memory blocks, a common access bus coupled to the plurality of memory blocks, and a host bus interface coupled to the common access bus and configured to provide communication between an external host and the plurality of memory blocks over the common access bus. The memory further includes a Built-In Self Test (BIST) module coupled to the common access bus and configured to communicate with the plurality of memory blocks over the common access bus, and a test access interface coupled to the BIST main module and configured to receive test instructions and test data, to provide the test data to the BIST main module, and to configure the BIST main module in response to the test instructions. BIST operations are carried out in the memory blocks in response to BIST control signals and test data transmitted by the BIST module over the common access bus.