The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

Oct. 24, 2006
Applicants:

Masayuki Nakamura, Tokyo, JP;

Hideyuki Yoko, Kodaira, JP;

Inventors:

Masayuki Nakamura, Tokyo, JP;

Hideyuki Yoko, Kodaira, JP;

Assignee:

Elpida Memory, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A ZQ calibration command is internally generated from an external command different from a ZQ calibration command so as to automatically perform an additional ZQ calibration operation. A command interval between an inputted command and a next command is effectively employed to obtain a ZQ calibration period. The external command different from the ZQ calibration command is preferably a self-refreshed command. The addition of the ZQ calibration operation shortens intervals between ZQ calibration operations. Thus, it is possible to obtain a ZQ calibration circuit capable of performing a ZQ calibration operation more accurately.


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