The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

May. 30, 2006
Applicant:

Shinichi Okita, Tokyo, JP;

Inventor:

Shinichi Okita, Tokyo, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); G06M 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

First, an operator inputs various parameters required for a mark recognition operation including a designated position coordinate designated via a mouse and a keyboard (step). Then, an edge potential position closest to the designated position is selected (step), or an edge potential position within a predetermined range having the designated position as a datum is selected (step), and a mark recognition operation is performed at the selected edge potential position (step). The recognition results are shown on a display (step).


Find Patent Forward Citations

Okita, Shinichi. (2010). Evaluation system and method of a search operation that detects a detection subject on an object (U.S. Patent No. 7838858). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7838858

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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