The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7838173 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 23, 2010

Filed:

Dec. 01, 2006
Applicants:

Ya Hui Chang, Hsin-Chu, TW;

Tsiao Chen Wu, Hsin-Chu, TW;

Shih-che Wang, Hsin-Chu, TW;

Inventors:

Ya Hui Chang, Hsin-Chu, TW;

Tsiao Chen Wu, Hsin-Chu, TW;

Shih-Che Wang, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 1/00 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure provides a mask. The mask includes a substrate; a first attenuating layer disposed on the substrate, having a first material and a first thickness corresponding to a phase shift; and a second attenuating layer having a second material and disposed on the first attenuating layer. The first and second attenuating layers define a first feature having a first opening extending through the first and second attenuating layers; and a second feature having a second opening extending through the second attenuating layer and exposing the first attenuating layer. One of the first and second features is a main feature and the other one is an assistant feature proximate to the main feature.


Find Patent Forward Citations

Chang, Ya. (2010). Structure design and fabrication on photomask for contact hole manufacturing process window enhancement (U.S. Patent No. 7838173). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7838173

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