The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2010
Filed:
Dec. 12, 2006
Frank E. Gennari, Berkeley, CA (US);
Ya-chieh Lai, Antioch, CA (US);
Matthew W. Moskewicz, Berkeley, CA (US);
Michael C. Lam, Rancho Cucamonga, CA (US);
Gregory R. Mcintyre, El Cerrito, CA (US);
Frank E. Gennari, Berkeley, CA (US);
Ya-Chieh Lai, Antioch, CA (US);
Matthew W. Moskewicz, Berkeley, CA (US);
Michael C. Lam, Rancho Cucamonga, CA (US);
Gregory R. McIntyre, El Cerrito, CA (US);
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
Systems and methods for creating and implementing two-dimensional (2D), image-based design rules (IBDRs) are disclosed. Techniques for creating 2D IBDR can include identifying a search pattern that is representative of a 2D pattern of interest of a design, creating a pattern representation based on the search pattern, defining an anchor point for the pattern representation, and assigning weights to elements of the pattern representation. The 2D IBDR can be used in systems and method for searching a design by comparing the 2D IBDR to the design. A number of 2D IBDRs can be merged into a subset of similar 2D IBDRs by characterizing desired rule geometries, sorting the 2D IBDRs into groups according to the desired rule geometries, merging the groups of 2D IBDRs into a single representative search pattern. Additionally, standard design rules can be created from the disclosed 2D IBDRs. The standard design rule can be created from a 2D pattern of interest by defining an origin of a shape within the 2D pattern of interest, identifying features within the 2D pattern of interest, deriving parameters relative to the origin for each of the identified features, and writing the standard design rule script using the derived parameters.