The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2010
Filed:
Oct. 23, 2007
Saket K. Goyal, San Jose, CA (US);
Thai Minh Nguyen, San Jose, CA (US);
Arun K. Gunda, San Jose, CA (US);
Saket K. Goyal, San Jose, CA (US);
Thai Minh Nguyen, San Jose, CA (US);
Arun K. Gunda, San Jose, CA (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A test system tests a circuit. Compressed scan data subsets are stored, one at a time, in a memory of the test system. The multiple compressed scan data subsets correspond with multiple scan chains in a function block of the tested circuit. Transmission of the compressed scan data subset from the memory to the tested circuit is controlled by the test system. The test system receives a compacted test output subset from the tested circuit and provides a test system output that indicates a presence of any errors in functioning of the tested circuit.