The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2010

Filed:

Nov. 10, 2006
Applicants:

Seock Hoon Bae, Seoul, KR;

Dong Hoon Lee, Seoul, KR;

Kang Hoon Chung, Gyeonggi-Do, KR;

Inventors:

Seock Hoon Bae, Seoul, KR;

Dong Hoon Lee, Seoul, KR;

Kang Hoon Chung, Gyeonggi-Do, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06F 19/00 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting two dimensional sketch data from source model data for three dimensional reverse modeling. The method includes the steps of detecting optional model data, establishing X-axis, Y-axis and Z-axis of the model data depending upon a reference coordinate system information inputted from a user, and setting a work plane for detecting two dimensional section data of the model data; projecting, on the work plane, two dimensional section data to be detected from the model data or polylines detected by designating a detection position; detecting two dimensional projected section data of the model data projected on the work plane, and dividing the two dimensional projected section data into feature segments depending upon a curvature distribution; and establishing a constraint and numerical information in accordance with connection of the divided feature segments of the two dimensional projected section data, and creating two dimensional sketch data.


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