The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2010

Filed:

Aug. 16, 2007
Applicants:

Naoto Tsujimura, Hitachinaka, JP;

Nobuo Suzuki, Hitachinaka, JP;

Shigeru Yano, Hitachinaka, JP;

Inventors:

Naoto Tsujimura, Hitachinaka, JP;

Nobuo Suzuki, Hitachinaka, JP;

Shigeru Yano, Hitachinaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to the present invention, a sample treatment system is capable of successfully detecting the shape of a stopper of a stopper-equipped sample vessel. A sample treatment system comprises: a sample rack for supporting a stopper-equipped sample vessel in which collected samples are stored; a transfer line for transferring the sample rack; a pretreatment unit that is lined up along the transfer line, and that performs various kinds of pretreatment; and a control unit for controlling the operation of the transfer line and that of the pretreatment unit; wherein the pretreatment unit includes a sample rack supplying unit, a centrifugal separation unit, a stopper opening unit, a dispensing unit, a stopper closing unit, a classification unit, and a sample storing unit, the sample treatment system further comprising shape detection means for detecting the shape of the stopper.


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