The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2010

Filed:

Sep. 18, 2006
Applicants:

Amir Mezer, Haifa, IL;

Harry Birenboim, Haifa, IL;

Inventors:

Amir Mezer, Haifa, IL;

Harry Birenboim, Haifa, IL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques are described herein that can be used to decode signals received over multiple channels. The received signals may be processed using noise reducing logic. Signal-to-noise ratio information per channel for signals received over each of the multiple channels may be considered to determine reliability information concerning the slicer input for each channel. Low density parity check codes or other forward error correction (FEC) codes may be used to decode the processed signals from all the multiple channels based on the reliability information.


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