The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Mar. 08, 2008
Volker Seyfried, Nussloch, DE;
Frank Schreiber, Dossenheim, DE;
Volker Seyfried, Nussloch, DE;
Frank Schreiber, Dossenheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
The invention relates to a confocal microscope which illuminates a sample () by means of at least one light source. A detection light beam () is emitted from the sample (). The detection light beam () is spectrally split up in a spatial manner by the dispersive element () and subsequently formed on a photosensor chip () by means of a detection optical system (). At least one expanding optical system () is arranged in front of the dispersive element () in the direction of the detection light beam (). The expanding optical system () is embodied in such a manner that the numerical aperture of the detection optical system () is independent from the numerical aperture of the detection light beam () on the detection apertured diaphragm ().