The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Sep. 27, 2006
David Sams, Columbia, SC (US);
Ronald T. Anderson, Lexington, SC (US);
David Sams, Columbia, SC (US);
Ronald T. Anderson, Lexington, SC (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A method and apparatus for point-to-point interconnect testing are described. In one embodiment, the method includes the determination of an expected behavior of a point-to-point link according to initial link training/configuration values of the link. The expected link behavior is determined according to link behavior during initial link configuration. A respective test value may be driven on at least one lane of the link to emulate lane break/degradation conditions during retraining of the link in response to a link reset. In one embodiment, an actual behavior of the link may be determined according to the behavior of the link during retraining of the link as lane break/degradation values are driven over the link. In one embodiment, a lane break/degradation condition is detected if the expected link behavior does not match the actual behavior of the link. Other embodiments are described and claimed.