The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2010

Filed:

Jul. 18, 2008
Applicants:

Hirokazu Tanaka, Yamanashi, JP;

Tsutomu Ishikawa, Yamanashi, JP;

Toyotoshi Machida, Yamanashi, JP;

Inventors:

Hirokazu Tanaka, Yamanashi, JP;

Tsutomu Ishikawa, Yamanashi, JP;

Toyotoshi Machida, Yamanashi, JP;

Assignee:

Eudyna Devices Inc., Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 3/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of controlling a semiconductor laser that has a plurality of wavelength selection portions having a different wavelength property from each other and is mounted on a temperature control device, including: a first step of correcting a temperature of the temperature control device according to a detected output wavelength of the semiconductor laser; and a second step of controlling at least one of the wavelength selection portions so that changing amount differentials between each wavelength property of the plurality of the wavelength selection portions is reduced, the changing amount differential being caused by correcting the temperature of the temperature control device.


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