The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Oct. 17, 2008
Applicants:
Chin-chen Kuo, Hsinchu, TW;
Wu-chieh Liu, Keelung, TW;
Hsiao-wen Lee, Hsinchu, TW;
Bii-cheng Chang, Hsinchu, TW;
Inventors:
Chin-Chen Kuo, Hsinchu, TW;
Wu-Chieh Liu, Keelung, TW;
Hsiao-Wen Lee, Hsinchu, TW;
Bii-Cheng Chang, Hsinchu, TW;
Assignee:
VisEra Technologies Company Limited, Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides an image sensor which comprises improved microlenses to cope with different optical requirements for oblique incident light or different components of light. In one embodiment, the image sensor comprises at least two microlenses having different radii of curvature. In another embodiment, the image sensor comprises at least one asymmetrical microlens.