The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Dec. 22, 2006
Applicants:
Chris J. Brookreson, Saint Helens, OR (US);
Daniel R. Bockelman, Portland, OR (US);
Benjamin M. Mauck, Portland, OR (US);
Louie Y. Liu, Austin, TX (US);
Inventors:
Chris J. Brookreson, Saint Helens, OR (US);
Daniel R. Bockelman, Portland, OR (US);
Benjamin M. Mauck, Portland, OR (US);
Louie Y. Liu, Austin, TX (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/00 (2006.01); G06F 1/04 (2006.01); H03D 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and an apparatus to detect over clocking of a processor are illustrated. The over clocking detector may detect as to whether the system clock of a microprocessor is over clocked and then generate an over clocking indicator. The over clocking indicator may be stored and accessed at a later time. The over clocking indicator may be retrieved through a test access port.