The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2010

Filed:

Jul. 11, 2007
Applicants:

Sudhir K. Sinha, New Orleans, LA (US);

Anthony B. Carter, New Orleans, LA (US);

Inventors:

Sudhir K. Sinha, New Orleans, LA (US);

Anthony B. Carter, New Orleans, LA (US);

Assignee:

Life Genetics Lab, LLC., Metairie, LA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The way to design a 'filled' site (which contains an interspersed element) primer set to target a particular locus is to design one of the two primers such that it encompasses that unique information (e.g., interspersed element+flanking genomic sequence+direct repeat). The way to design an 'empty' site primer is to design one of the two primers such that the entire direct repeat sequence in addition to flanking genomic sequence is included on both sides. To improve efficiency, the “empty” site primer designed around the direct repeat should not be too long. This primer design of the present invention allows for the ability to test any type of interspersed genetic element containing characteristic direct repeat sequences (direct repeats). This gives the option of many new polymorphic marker sites because Alu elements are not the only interspersed genetic elements having direct repeats flanking their core sequence.


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