The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7790581 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 07, 2010

Filed:

Jan. 09, 2006
Applicants:

Byeong Y. Kim, LaGrangeville, NY (US);

Xiaomeng Chen, Poughkeepsie, NY (US);

Woo-hyeong Lee, Poughquag, NY (US);

Huilong Zhu, Poughkeepsie, NY (US);

Inventors:

Byeong Y. Kim, LaGrangeville, NY (US);

Xiaomeng Chen, Poughkeepsie, NY (US);

Woo-Hyeong Lee, Poughquag, NY (US);

Huilong Zhu, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 21/36 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A pair of semiconductor structures and a method for fabricating a semiconductor structure each utilize a semiconductor substrate having a first crystallographic orientation, and a dielectric layer located thereupon. The method provides for epitaxially growing a semiconductor layer on the semiconductor substrate to encapsulate the dielectric layer. The method also provides for patterning the semiconductor layer to yield a semiconductor structure that comprises a bulk semiconductor structure and a semiconductor-on-insulator structure, or alternatively a patterned semiconductor layer that straddles the dielectric layer and contacts the semiconductor substrate.


Find Patent Forward Citations

Kim, Byeong. (2010). Semiconductor substrate with multiple crystallographic orientations (U.S. Patent No. 7790581). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7790581

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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